INFRARED REFLECTION SPECTRA OF HG1-XZNXTE CRYSTALS

Hg1-xZnxTe crystals were grown by the traveling heater method. The com position and crystalline quality of ingots were analyzed by electrolyt e electroreflectance experiment. The far-infrared reflection spectra o f Hg1-xZnxTe crystals with various composition x were measured at temp eratures ranging from 90 K to 295 K in the wavenumber region of 60 to 450 cm(-1). In all but the pure compounds, HgTe and ZnTe, a two TO pho non structure was clearly observed. The optical phonon frequencies wer e well-determined by both the Kramers-Kronig integrations and the dyna mic dielectric function fitting, and their temperature dependence is d iscussed.