Using a Tersoff-type empirical potential energy function, the free ene
rgy of formation for microvoids in silicon containing from 1 to 57 vac
ancies was calculated asa function of temperature and vacancy supersat
uration. The results apply equally well to microvoid nucleation during
crystal growth or, at low temperatures, as a consequence of ion impla
ntation. The results indicate that homogeneous nucleation is an unlike
ly process for the crystal growth case where heterogeneous nucleation
via adsorbate attachment to the microvoid surface is a very likely pro
cess. (C) 1995 American Institute of Physics.