ANODICALLY GROWN POROUS SILICON STRUCTURE - FORMATION MECHANISMS

Citation
Dm. Soares et al., ANODICALLY GROWN POROUS SILICON STRUCTURE - FORMATION MECHANISMS, Chemical physics letters, 242(1-2), 1995, pp. 202-206
Citations number
14
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
Journal title
ISSN journal
00092614
Volume
242
Issue
1-2
Year of publication
1995
Pages
202 - 206
Database
ISI
SICI code
0009-2614(1995)242:1-2<202:AGPSS->2.0.ZU;2-S
Abstract
It is experimentally shown, in porous silicon formation, that there is an increase in dissolution rate at fluorine-covered sites of the sili con surface due to the presence of excess electrons coming from the ox idation of molecular hydrogen at hydrogen-covered sites. The increase in dissolution rate in the presence of excess charge at the fluorine-c overed sites is investigated theoretically by a semi-empirical Hartree -Fock calculation which shows that this spatially variable dissolution generates the porous silicon structure.