L. Hernan et al., DIFFRACTION AND XPS STUDIES OF MISFIT LAYER CHALCOGENIDES INTERCALATED WITH COBALTOCENE, Chemistry of materials, 7(8), 1995, pp. 1576-1582
Polycrystalline samples of (PbS)(1.18)(TiS2)(2), (PbS)(1.14)(TaS2)(2),
and (PbSe)(1.12)(NbSe2)(2), ternary chalcogenides, have been intercal
ated with cobaltocene by direct reaction of the organome-tallic compou
nd in acetonitrile solutions. Powder X-ray and electron diffraction da
ta support a model in which the cobaltocene molecule is located in all
TX(2)-TX(2) (T = transition metal; X = S2- or Se2-) interfaces of the
se misfit layer compounds, whereas the MX-TX(2) (M = Pb) interfaces ar
e empty. X-ray photoelectron spectroscopy (XPS) revealed the presence
of two different oxidized cobalt species in these intercalated samples
. Thus, in situ experiments of cobaltocene deposition from the gas pha
se, under UHV conditions, onto clean surfaces of binary and ternary ch
alcogenides, allowed the identification of these cobalt species as CoC
p(2) and [CoCp(2)](+) (Cp = eta(5)-C5H5). It has also been shown by XP
S that the intercalation of cobaltocene does not affect the core bindi
ng energies of the host matrix elements.