VTS 1995 - THE INFLUENCE OF DEEP-SUBMICRON TECHNOLOGY ON TESTING

Authors
CAMPBELL RI
Citation
Ri. Campbell, VTS 1995 - THE INFLUENCE OF DEEP-SUBMICRON TECHNOLOGY ON TESTING, IEEE design & test of computers, 12(3), 1995, pp. 4-4
Citations number
NO
Categorie Soggetti
Computer Sciences","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
12
Issue
3
Year of publication
1995
Pages
4 - 4
Database
ISI
SICI code
0740-7475(1995)12:3<4:V1-TIO>2.0.ZU;2-B