ELECTROCHEMICAL ASPECTS OF CORROSION-RESISTANCE AND ETCHING OF METALLIZATIONS FOR MICROELECTRONICS

Citation
Rb. Comizzoli et al., ELECTROCHEMICAL ASPECTS OF CORROSION-RESISTANCE AND ETCHING OF METALLIZATIONS FOR MICROELECTRONICS, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 198(1-2), 1995, pp. 153-160
Citations number
13
Categorie Soggetti
Material Science
ISSN journal
09215093
Volume
198
Issue
1-2
Year of publication
1995
Pages
153 - 160
Database
ISI
SICI code
0921-5093(1995)198:1-2<153:EAOCAE>2.0.ZU;2-W
Abstract
The electrochemical aspects of metal etching to form patterned conduct ors and of corrosion of conductors in the field are closely related. B oth need to be considered in designing metallization structures for mi croelectronic devices. The evolution of a manufacturing process for a multi-level interconnect structure is discussed from an electrochemica l perspective. A galvanic corrosion problem during manufacture and its solution for the interconnect metallization on a silicon integrated c ircuit are also discussed. Following the discussion on etching process es and corrosion during manufacture, a discussion of electrochemical a nd electrolytic failure mechanisms for electronic equipment in field e nvironments and some steps that can be taken to prevent harmful enviro nmental effects are presented. Recent research on the adhesion of vari ous protective coatings and interlevel polymeric dielectrics is presen ted in the context of failure prevention.