Rb. Comizzoli et al., ELECTROCHEMICAL ASPECTS OF CORROSION-RESISTANCE AND ETCHING OF METALLIZATIONS FOR MICROELECTRONICS, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 198(1-2), 1995, pp. 153-160
The electrochemical aspects of metal etching to form patterned conduct
ors and of corrosion of conductors in the field are closely related. B
oth need to be considered in designing metallization structures for mi
croelectronic devices. The evolution of a manufacturing process for a
multi-level interconnect structure is discussed from an electrochemica
l perspective. A galvanic corrosion problem during manufacture and its
solution for the interconnect metallization on a silicon integrated c
ircuit are also discussed. Following the discussion on etching process
es and corrosion during manufacture, a discussion of electrochemical a
nd electrolytic failure mechanisms for electronic equipment in field e
nvironments and some steps that can be taken to prevent harmful enviro
nmental effects are presented. Recent research on the adhesion of vari
ous protective coatings and interlevel polymeric dielectrics is presen
ted in the context of failure prevention.