ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY IN MATERIALS RESEARCH

Authors
BAUER HD THOMAS J WETZIG K
Citation
Hd. Bauer et al., ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY IN MATERIALS RESEARCH, Physica status solidi. a, Applied research, 150(1), 1995, pp. 141-152
Citations number
14
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica status solidi. a, Applied research → ACNP
ISSN journal
00318965
Volume
150
Issue
1
Year of publication
1995
Pages
141 - 152
Database
ISI
SICI code
0031-8965(1995)150:1<141:ATEIMR>2.0.ZU;2-S
Abstract
The characterisation of Various materials by analytical TEM methods fr equently requires methodical developments, which go beyond the routine handling of instrumental techniques. Interactions between materials c haracterisation and methodical improvement are demonstrated at example s of depth profile analysis, of electron energy loss and X-ray spectro scopy, and of electron diffraction.