THE DEPENDENCE OF QUANTUM-WELL FEATURES IN PHOTOEMISSION ON FILM QUALITY

Authors
MEINEL K BECKMANN A KLAUA M BETHGE H
Citation
K. Meinel et al., THE DEPENDENCE OF QUANTUM-WELL FEATURES IN PHOTOEMISSION ON FILM QUALITY, Physica status solidi. a, Applied research, 150(1), 1995, pp. 521-530
Citations number
45
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica status solidi. a, Applied research → ACNP
ISSN journal
00318965
Volume
150
Issue
1
Year of publication
1995
Pages
521 - 530
Database
ISI
SICI code
0031-8965(1995)150:1<521:TDOQFI>2.0.ZU;2-M
Abstract
The dependence of features of quantum-well states on film morphology a nd film composition is investigated for epitaxial Ag/Au(111) film syst ems by means of angular-resolved photoemission spectroscopy. Using per fect Ag/Au(111) film samples of smooth and chemically sharp interfaces as references the modification of quantum-well peaks induced by surfa ce and interface roughness and by interdiffusion, respectively, is stu died. The results demonstrate new possibilities of characterizing thin films by analysing quantum-well states in photoemission.