PREPARATION AND ANALYSIS OF TARGETS WITH IMPLANTED THICK AR LAYERS FOR IN-BEAM GAMMA-SPECTROSCOPY

Authors
GRABOWY U BUSCH H GOHLA A SPEIDEL KH KREMEYER S JAKOB G FREITAG K GERBER J ASSMANN W
Citation
U. Grabowy et al., PREPARATION AND ANALYSIS OF TARGETS WITH IMPLANTED THICK AR LAYERS FOR IN-BEAM GAMMA-SPECTROSCOPY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 101(4), 1995, pp. 422-426
Citations number
10
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
101
Issue
4
Year of publication
1995
Pages
422 - 426
Database
ISI
SICI code
0168-583X(1995)101:4<422:PAAOTW>2.0.ZU;2-T
Abstract
Implantation of 80 keV Ar-40 ions into 0.5 mg/cm(2) thick Fe layers, d eposited by vacuum evaporation onto a Gd foil, yielded an Ar target of 35(6) mu g/cm(2) thickness which is suitable for in-beam gamma-spectr oscopy. Thin Fe-layer evaporation and implantation were successively a pplied in several cycles whereby the Ar implantation always occurred i nto a newly prepared Fe layer. These procedures can principally be ext ended for obtaining even larger thicknesses. The Ar content of the tar get and its layer thickness were accurately determined by the Elastic Recoil Detection Analysis technique using a Ni-58 beam.