We have studied the morphology of thin cobalt films on Cu(1117) using
scanning tunneling microscopy. Submonolayer quantities of cobalt depos
ited at room temperature lead to a dramatic roughening of the steps in
volving a substantial restructuring of the copper template. It is argu
ed that this restructuring is caused by the cobalt-induced misfit stra
in. Films of 2-3 monolayer thickness display a rather rugged structure
with many steps oriented perpendicular to the original step direction
. With further deposition of cobalt, the steps become smoother and eve
ntually above about 5 to 8 monolayers one has step flow growth with sm
ooth steps. In agreement with earlier observations we find that pinhol
es remain in the film during growth. Their density decreases with the
film thickness and disappears above five monolayers. Upon annealing to
380 K, the pinholes in the thin layers grow to large, rectangular sha
ped pits with a mean size of about 10 nm. Eventually copper begins to
migrate onto the cobalt film. The growth of the pits is attributed to
the release of misfit strain in the cobalt layer. The relation between
the film morphology and the magnetic anisotropy is discussed.