W. Dusi et al., A STUDY OF TEMPERATURE-DEPENDENCE OF SOME RELEVANT PARAMETERS PERFORMED ON A SET OF CDTE DETECTORS, IEEE transactions on nuclear science, 42(4), 1995, pp. 263-266
Cadmium telluride is a semiconductor material which is now widely used
in both spectroscopic and imaging applications. Among its properties,
the most advantageous is its ability to operate at room-temperature,
so as to avoid the need of bulk cooling devices. Nevertheless, a quant
itative evaluation of the temperature dependence of the detectors resp
onse is needed in order to establish a temperature range for safe oper
ations. In this paper, some parameters are evaluated at temperatures r
anging from -35 degrees C up to 40 degrees C with an energy source of
511 keV for a set of three spectroscopy grade CdTe detectors. The data
obtained seem to indicate a significant temperature independence belo
w 0 degrees C, while at temperatures over 10 degrees C spectra degrada
tions occur.