the epitaxial silicon chemical vapor deposition by SiCl4/H-2 mixtures
in a LPE 861 barrel reactor has been simulated by means of a detailed
2D model solved by the commercial finite element code FIDAP. Different
reactor configurations (i.e., bell diameter, gas diffusers, susceptor
tilting angle) and deposition conditions (i.e., flow rates and reacto
r pressure) have been examined. The simulation have been satisfactoril
y compared with experimental growth rate data measured along the react
or axial coordinate.