The electron backscattering pattern technique has been applied to the
microstructural investigation of Tl(1223) thick films formed by vapor-
phase thallination of Ag-containing Ba-Ca-Cu-oxide precursors. For sam
ples grown on polycrystalline YSZ, considerable biaxial alignment is f
ound in localized, multigrain regions as wide a 100 mu m or more. Howe
ver, on scales above 1 mm the overall texture remains only uniaxial wi
th the c-axes (i.e., [001]) aligned perpendicular to the plane of the
substrate. On single-crystal KTaO3 an epitaxial relationship is eviden
t which persists to the surface of a 3 mu m thick film. Modest variati
ons in the processing protocol yield films containing grains oriented
with the c-axis in the plane, resulting in the degradation of transpor
t properties. The data suggest a growth mode in which sparse nucleatio
n occurs at the substrate followed by rapid lateral crystallization.