EFFECT OF SUBSTRATE THICKNESS AND METALLIZATION THICKNESS ON DISPERSION CHARACTERISTICS OF CPW

Citation
Ak. Rastogi et al., EFFECT OF SUBSTRATE THICKNESS AND METALLIZATION THICKNESS ON DISPERSION CHARACTERISTICS OF CPW, International journal of infrared and millimeter waves, 16(8), 1995, pp. 1393-1406
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied",Optics
ISSN journal
01959271
Volume
16
Issue
8
Year of publication
1995
Pages
1393 - 1406
Database
ISI
SICI code
0195-9271(1995)16:8<1393:EOSTAM>2.0.ZU;2-C
Abstract
Approximate conformal mapping techniques have been used for analysing the effect of finite substrate thickness on coplanar wave guide (CPW). Calculations for impedance and effective dielectric constant are pres ented for CPW's with finite substrate thicknesses. Analytical formulat ion are presented for calculations. Network analytical methods of elec tromagnetic fields are employed to evaluate the effect of thick metal coating on CPW. Dispersion characteristics of CPW have been plotted fo r various metallization thicknesses. Effect of thick metal coating on guide wavelength is also plotted. Increase in metallization thickness of CPW causes an increase in wavelength. Due to this fact characterist ic impedance and effective dielectric constant decreases.