AGGREGATION OF IGG ON METHYLATED SILICON SURFACES STUDIED BY TAPPING MODE ATOMIC-FORCE MICROSCOPY

Citation
B. Walivaara et al., AGGREGATION OF IGG ON METHYLATED SILICON SURFACES STUDIED BY TAPPING MODE ATOMIC-FORCE MICROSCOPY, Journal of colloid and interface science, 174(1), 1995, pp. 53-60
Citations number
22
Categorie Soggetti
Chemistry Physical
ISSN journal
00219797
Volume
174
Issue
1
Year of publication
1995
Pages
53 - 60
Database
ISI
SICI code
0021-9797(1995)174:1<53:AOIOMS>2.0.ZU;2-M
Abstract
Tapping mode atomic force microscopy was used to study aggregation pat terns of human immunoglobulin G (IgG) adsorbed from aqueous solutions onto silicon surfaces methylated in dichlorodimethylsilane. Formation of dendrite-like aggregates of IgG were observed after air exposure an d appeared to be highly dependent on surface methylation as well as on protein concentration. Crosslinking the protein layer in 0.5% glutara ldehyde prior to air exposure resulted in homogeneous protein distribu tions with significantly reduced aggregation. This, and experiments us ing lyophilization techniques, indicates that aggregates form due to a lateral reorganization of the adsorbed protein layer at the air-liqui d interface. (C) 1995 Academic Press,Inc.