Pw. Park et al., OPTICAL SWITCHING MECHANISM-BASED ON CHARGE ACCUMULATION EFFECTS IN RESONANT-TUNNELING DIODES, Applied physics letters, 67(9), 1995, pp. 1241-1243
We have identified the charge accumulation effects in a resonant tunne
ling diode for the application of optical switching by observing the h
ole tunneling peak under illumination with a Ti:sapphire laser. Two me
chanisms, photocurrent and charge accumulation, are rigorously examine
d to determine which one is the dominant effect for optical switching
by comparing the current-voltage (I-V) characteristics for forward bia
ses and reverse biases. It is believed that the hole accumulation effe
ct in the depletion region, which results in the hole tunneling curren
t, is responsible for the shift of the I-V curves. (C) 1995 American I
nstitute of Physics.