OPTICAL SWITCHING MECHANISM-BASED ON CHARGE ACCUMULATION EFFECTS IN RESONANT-TUNNELING DIODES

Citation
Pw. Park et al., OPTICAL SWITCHING MECHANISM-BASED ON CHARGE ACCUMULATION EFFECTS IN RESONANT-TUNNELING DIODES, Applied physics letters, 67(9), 1995, pp. 1241-1243
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
67
Issue
9
Year of publication
1995
Pages
1241 - 1243
Database
ISI
SICI code
0003-6951(1995)67:9<1241:OSMOCA>2.0.ZU;2-T
Abstract
We have identified the charge accumulation effects in a resonant tunne ling diode for the application of optical switching by observing the h ole tunneling peak under illumination with a Ti:sapphire laser. Two me chanisms, photocurrent and charge accumulation, are rigorously examine d to determine which one is the dominant effect for optical switching by comparing the current-voltage (I-V) characteristics for forward bia ses and reverse biases. It is believed that the hole accumulation effe ct in the depletion region, which results in the hole tunneling curren t, is responsible for the shift of the I-V curves. (C) 1995 American I nstitute of Physics.