N. Iwamuro et al., A NEW VERTICAL IGBT STRUCTURE WITH A MONOLITHIC OVER-CURRENT, OVER-VOLTAGE, AND OVER-TEMPERATURE SENSING AND PROTECTING CIRCUIT, IEEE electron device letters, 16(9), 1995, pp. 399-401
A new 600 V vertical Insulated Gate Bipolar Transistor (IGBT) structur
e with monolithically integrated over-current, over-voltage, and over-
temperature sensing and protecting functions has been developed to exp
loit an extremely excellent tradeoff characteristic between an on-stat
e voltage drop and a turn-off time for the first time. This device can
be easily made by the conventional IGBT fabrication process, An accur
ate and a realtime device temperature detection, as well as a high wit
hstand capability against over-current and over-voltage conditions (sh
ort circuit immunity of 30 mu sec, clamped collector voltage of 640 V)
, have been achieved, Furthermore, an excellent trade-off characterist
ic of 1.40 V as an on-state voltage drop and of 0.18 mu sec as a fall
time is also obtained.