MODULATION TRANSFER-FUNCTION EVALUATION OF LINEAR SOLID-STATE X-RAY-SENSITIVE DETECTORS USING EDGE TECHNIQUES

Authors
ZHU YM KAFTANDJIAN V PEIX G BABOT D
Citation
Ym. Zhu et al., MODULATION TRANSFER-FUNCTION EVALUATION OF LINEAR SOLID-STATE X-RAY-SENSITIVE DETECTORS USING EDGE TECHNIQUES, Applied optics, 34(22), 1995, pp. 4937-4943
Citations number
12
Categorie Soggetti
Optics
Journal title
Applied optics → ACNP
ISSN journal
00036935
Volume
34
Issue
22
Year of publication
1995
Pages
4937 - 4943
Database
ISI
SICI code
0003-6935(1995)34:22<4937:MTEOLS>2.0.ZU;2-A
Abstract
The exact determination of the modulation transfer function (MTF) of a physical system is a persistent problem. We present a practical metho d of measuring numerically the MTF of linear solid-state x-ray-sensiti ve detectors. The method is based on the use of edge techniques and al lows us to obtain the MTF of a linear detector from its edge-spread fu nction (ESF). ESF measurement techniques are discussed in detail, and calculation of the corresponding MTF's are shown.