FORMATION ENERGIES AND ELECTRONIC-STRUCTURES OF NATIVE DEFECTS IN GAN

Citation
Jj. Xie et al., FORMATION ENERGIES AND ELECTRONIC-STRUCTURES OF NATIVE DEFECTS IN GAN, Chinese Physics Letters, 13(11), 1996, pp. 867-869
Citations number
20
Categorie Soggetti
Physics
Journal title
ISSN journal
0256307X
Volume
13
Issue
11
Year of publication
1996
Pages
867 - 869
Database
ISI
SICI code
0256-307X(1996)13:11<867:FEAEON>2.0.ZU;2-9
Abstract
The electronic structures and the formation energies of native point d efects in cubic GaN have been studied via the linear muffin-tin orbita l method. The results show that the nitrogen vacancy is the dominant d efect in the intrinsic cubic GaN. Among the antisites and interstitial defects, it is found that a tetrahedral interstitial nitrogen atom su rrounded by four Ga atoms N-TGa is most easily formed, and the formati on energy of N-Ga antisite is much less than that of Ga-N antisite. Th e changes of the density of states due to the introduction of defects are discussed.