NORMAL INCIDENCE GRATING SPECTROMETER FOR INVERSE-PHOTOEMISSION

Citation
Te. Ollonqvist et Ij. Vayrynen, NORMAL INCIDENCE GRATING SPECTROMETER FOR INVERSE-PHOTOEMISSION, Vacuum, 46(8-10), 1995, pp. 1177-1180
Citations number
37
Categorie Soggetti
Physics, Applied
Journal title
VacuumACNP
ISSN journal
0042207X
Volume
46
Issue
8-10
Year of publication
1995
Pages
1177 - 1180
Database
ISI
SICI code
0042-207X(1995)46:8-10<1177:NIGSFI>2.0.ZU;2-9
Abstract
An ultraviolet k-resolved inverse photoemission spectrometer (KRIPES) is constructed for studies of the unoccupied electronic states of soli ds and surfaces. The spectrometer is based on the spherical grating in the off-Rowland geometry The sample is bombarded by low-energy electr ons from the electron source with the minimum energy distribution widt h of 0.25 eV. The UV photons emitted from the sample are dispersed by the grating onto the position-sensitive defector. The spectra can be m easured in the photon energy range from 10 eV to 40 eV with parallel d etection of the wavelength region 560 Angstrom and with an optical res olution of about 8 Angstrom. The overall resolution of the spectromete r is determined to be from 0.26 eV at 10.0 eV to 0.6 eV at 30 eV by me asuring the Fermi edge of the polycrystalline gold sample. The typical collection time per spectrum is about an hour with total amount of 30 00 c/ch at the Fermi edge of gold when the beam current and energy are 25 mu A and 23 eV, respectively. The resolution of the optical system is obtained from the emission line of a uncleaned tantalum sample at the photon energy of 14.8 eV. In the k-resolved measurement of Cu(110) surface the spectra show the typical band dispersion.