CHARACTERIZATION OF THE 1 AND 2 ML SILVER FILMS ON THE V(100) SURFACE

A growth mode of silver ultrathin films on the V(100) surface was stud ied by Auger electron spectroscopy, angular resolved ultraviolet photo electron spectroscopy, X-ray photoelectron spectroscopy, thermal desor ption spectroscopy, low energy electron diffraction, electron energy l oss spectroscopy and work function change (w.f.c.) measurements. The f irst two silver layers grow on a V(100) surface in a layer-by-layer mo de in a wide temperature range (250-900 K). The atoms of both layers a re sitting in registry with the substrate mesh producing a bcc (100) o rdered silver ultrathin film.