ON THE GENERATION OF AREA-TIME OPTIMAL TESTABLE ADDERS

Citation
B. Becker et al., ON THE GENERATION OF AREA-TIME OPTIMAL TESTABLE ADDERS, IEEE transactions on computer-aided design of integrated circuits and systems, 14(9), 1995, pp. 1049-1066
Citations number
44
Categorie Soggetti
Computer Application, Chemistry & Engineering","Computer Science Hardware & Architecture
ISSN journal
02780070
Volume
14
Issue
9
Year of publication
1995
Pages
1049 - 1066
Database
ISI
SICI code
0278-0070(1995)14:9<1049:OTGOAO>2.0.ZU;2-6
Abstract
We present a performance driven generator for integer adders which has the following interesting feature: The generator is parametrized in t he operands' bitlength n, the delay of the addition t(n), and the faul t model FM. FM may in particular be chosen as the classical stuck-at f ault model, the cellular fault model or the robust path delay fault mo del. The output of the generator is a performance oriented conditional sum type adder, i.e., an area-minimal n-bit adder of the ''conditiona l sum type'' with delay less than or equal to t(n) (if it exists) toge ther with a small complete test set with respect to the chosen fault m odel FM.