B. Becker et al., ON THE GENERATION OF AREA-TIME OPTIMAL TESTABLE ADDERS, IEEE transactions on computer-aided design of integrated circuits and systems, 14(9), 1995, pp. 1049-1066
We present a performance driven generator for integer adders which has
the following interesting feature: The generator is parametrized in t
he operands' bitlength n, the delay of the addition t(n), and the faul
t model FM. FM may in particular be chosen as the classical stuck-at f
ault model, the cellular fault model or the robust path delay fault mo
del. The output of the generator is a performance oriented conditional
sum type adder, i.e., an area-minimal n-bit adder of the ''conditiona
l sum type'' with delay less than or equal to t(n) (if it exists) toge
ther with a small complete test set with respect to the chosen fault m
odel FM.