INFLUENCE OF THE MICROSTRUCTURE ON DIELECTRIC AND CONDUCTING PROPERTIES OF VANADIUM PENTOXIDE

Citation
F. Ragot et al., INFLUENCE OF THE MICROSTRUCTURE ON DIELECTRIC AND CONDUCTING PROPERTIES OF VANADIUM PENTOXIDE, Journal of materials chemistry, 5(8), 1995, pp. 1155-1161
Citations number
28
Categorie Soggetti
Chemistry Physical","Material Science
ISSN journal
09599428
Volume
5
Issue
8
Year of publication
1995
Pages
1155 - 1161
Database
ISI
SICI code
0959-9428(1995)5:8<1155:IOTMOD>2.0.ZU;2-1
Abstract
Dielectric and conductivity studies have been performed on compacted p owders of vanadium pentoxide V2O5 in a broad frequency range 1 kHz-10 GHz, as a function of temperature and density (porosity). The spectra show the existence of relaxation due to grain boundary polarization ph enomena. These depend on the synthesis method, i.e., on the microstruc ture: when the density increases and the average size of the grains de creases the relaxation frequencies increase. Moreover, it has been sho wn that is possible to determine the real static permittivity and dc-c onductivity of polycrystalline V2O5 by taking account of grain boundar ies and porosity effects.