F. Ragot et al., INFLUENCE OF THE MICROSTRUCTURE ON DIELECTRIC AND CONDUCTING PROPERTIES OF VANADIUM PENTOXIDE, Journal of materials chemistry, 5(8), 1995, pp. 1155-1161
Dielectric and conductivity studies have been performed on compacted p
owders of vanadium pentoxide V2O5 in a broad frequency range 1 kHz-10
GHz, as a function of temperature and density (porosity). The spectra
show the existence of relaxation due to grain boundary polarization ph
enomena. These depend on the synthesis method, i.e., on the microstruc
ture: when the density increases and the average size of the grains de
creases the relaxation frequencies increase. Moreover, it has been sho
wn that is possible to determine the real static permittivity and dc-c
onductivity of polycrystalline V2O5 by taking account of grain boundar
ies and porosity effects.