Ud. Schwarz et al., GROWTH OF C-60 THIN-FILMS ON GES(001) STUDIED BY SCANNING FORCE MICROSCOPY, Physical review. B, Condensed matter, 52(8), 1995, pp. 5967-5976
The epitaxial growth of C-60 thin films sublimed onto GeS(001) substra
tes under ultrahigh-vacuum conditions was investigated in the range of
0.7-11 monolayers coverage by scanning force microscopy in air. The g
rowth process follows basically a layer-by-layer mechanism if evaporat
ed in the narrow temperature range from 180 to 200 degrees C, but was
found to be very sensitive to even small changes in temperature. At su
bstrate temperatures above 200 degrees C, the second and higher layers
are not stable. For temperatures close to 200 degrees C, our studies
indicate pure layer-by-layer-type growth. Somewhat fewer substrate tem
peratures lead to the formation of two different types of triangular-s
haped islands which originate from a different stacking of the molecul
es, beginning with the second layer. Triangular islands belonging to t
he same type tend to coalesce, whereas islands of different types are
separated by grooves. At substrate temperatures close to 180 degrees C
during evaporation, dendritic islands are formed due to the limited m
obility of the C-60 molecules at this temperature. Furthermore, the gr
owth mode changes to a nonideal layer-by-layer growth where the second
and even higher layers start to grow before the first layer has been
completed. This behavior can well be explained by a two-dimensional di
ffusion-limited growth mechanism. Finally, substrate temperatures sign
ificantly lower than 180 degrees C result in films without long-range
order.