PREPARATION AND CHARACTERIZATION OF CDTE THIN-FILMS DEPOSITED BY CSS

In this work a new procedure based on the close-spaced sublimation (CS S) technique has been developed to prepare CdTe thin films. The role o f various preparation parameters has been investigated and the optimum conditions have been outlined. Studies of the structural properties o f the CdTe films, carried out by XRD and SEM, showed a strong influenc e of the substrate and evaporation temperatures on the crystallographi c orientation of the films, which grow with a structure composed by a mixture of cubic and hexagonal phases. Special emphasis has been made on the effect of introducing O-2 during the deposition of the CdTe fil ms on the resistivity of the samples. It was possible to shift the res istivity of the films by an adequate choice of the oxygen partial pres sure and the source-substrate separation, from values around 10(4) Ome ga cm to values of about 0.4 Omega cm.