DETERMINATION OF CO, CR, MN AND NI TRACES IN FLUORINE-CONTAINING MATERIALS FOR OPTICAL FIBERS USING LASER-ENHANCED IONIZATION TECHNIQUES WITH FLAME AND ROD-FLAME ATOMIZERS
Nv. Chekalin et al., DETERMINATION OF CO, CR, MN AND NI TRACES IN FLUORINE-CONTAINING MATERIALS FOR OPTICAL FIBERS USING LASER-ENHANCED IONIZATION TECHNIQUES WITH FLAME AND ROD-FLAME ATOMIZERS, Spectrochimica acta, Part B: Atomic spectroscopy, 50(8), 1995, pp. 753-761
Two fluorine-containing materials (NH4F and NaF) for optical fiber pro
duction have been analyzed with respect to their contents of Co, Cr, M
n and Ni using two different laser enhanced ionization (LEI) technique
s, one using a rod-flame as an atomization-ionization system and one u
sing a flame as the atomizer. One advantage of the rod-flame system is
that it can separate the evaporation and atomization steps which ther
eby leads to a reduction of the influences of matrices. Another advant
age is that it can be used for analysis of both solid and liquid sampl
es. The NH4F sample was analyzed as a solid and also as a solution (di
ssolved to 50 or 100 g/l in water). In the flame atomizer the NH4F mat
rix created a non-selective ionization background giving detection lim
its in the order of tens of ng/g (concentrations in the solid sample).
Using the rod-flame system, however, it was found that Cr, Mn, and Ni
could be determined in the NH4F sample down to a few ng/g by analysis
of the sample solutions without any need for preconcentration procedu
res. Direct analysis of solid samples, without any sample preparation,
could also be done using the rod-flame system with a ten-fold improve
ment in detectability. The detection limits for analysis of the solid
samples were estimated to be the following: Co, 1 ng/g; Cr, 0.2 ng/g;
Mn, 0.3 ng/g; and Ni, 0.08 ng/g. The NaF sample was more complicated t
o analyze. When using the flame, a significant ionization background w
as obtained even for solutions diluted down to 0.2 g/l. However, using
the rod-flame system, analysis of the elemental content of the NaF sa
mple could be performed. Detection limits in the range of tens of ng/g
could be obtained from diluted solutions (less than or equal to 20 g/
l). It was found that the NH4F and NaF material contained the followin
g concentrations of impurities (HN4F: Cr, 70 +/- 5 ng/g; Mn, 88 +/- 6
ng/ g; and Ni, 56 +/- 5 ng/g. NaF: Cr, 290 +/- 70 ng/g; Mn, 40 +/- 15
ng/g; and Ni 2200 +/- 400 ng/g). For the case of Co, only an upper lim
it could be assessed (<1 ng/g for NH4F and <70 ng/g for NaF).