IMAGING MODES IN ATOMIC-FORCE MICROSCOPY

Authors
PARRAT D SOMMER F SOLLETI JM DUE TM
Citation
D. Parrat et al., IMAGING MODES IN ATOMIC-FORCE MICROSCOPY, Journal of trace and microprobe techniques, 13(3), 1995, pp. 343-352
Citations number
12
Categorie Soggetti
Chemistry Analytical
Journal title
Journal of trace and microprobe techniques → ACNP
ISSN journal
07334680
Volume
13
Issue
3
Year of publication
1995
Pages
343 - 352
Database
ISI
SICI code
0733-4680(1995)13:3<343:IMIAM>2.0.ZU;2-H
Abstract
After a brief overview of the interacting forces between an atomic tip and a surface, this paper reviews the various imaging modes by Atomic Force Microscopy : contact, friction or lateral forces, force modulat ion, non contact and tapping modes. Applications for the study of biol ogical samples and biomaterials illustrate each operating mode.