The F-19 (p, alpha gamma)O-16 resonance nuclear reaction at E(R) = 872
, 1KeV was used to measure the depth profiles of implanted F-19(+) in
titanium samples. A proper convolution calculation procedure was used
to extract the depth profiles of fluorine from the experimental excita
tion yield curves. The range parameters, R(p) and Delta R(p) obtained
in this work were compared with those obtained by Monte Carlo simulati
on with TRIM'90 code as well as a computer code developed recently in
this group.