MICROPROBE SYSTEMS WITH AMPLIFIED DEFLECTION

Authors
YAVOR SY
Citation
Sy. Yavor, MICROPROBE SYSTEMS WITH AMPLIFIED DEFLECTION, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 363(1-2), 1995, pp. 131-134
Citations number
3
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
363
Issue
1-2
Year of publication
1995
Pages
131 - 134
Database
ISI
SICI code
0168-9002(1995)363:1-2<131:MSWAD>2.0.ZU;2-Z
Abstract
Additional deflection of charged particle beams may be performed with the aid of quadrupole lens systems. A design of a triplet and a quadru plet of quadrupoles is described for focusing and deflection of MeV en ergy ion beams emerging from a cyclotron. A three times increase of th e deflection angle has been achieved.