ADVANCED SURFACE-ANALYSIS OF SILICATE-GLASSES, OXIDES AND OTHER INSULATING MATERIALS - A REVIEW

The present paper describes recent progress in characterization of the glass surface structure and minimization of the disturbance of the co mposition and structure during investigations employing sputtering. Co nsiderations regarding the suitable choice of combinations of surface analysis methods, together with analytical electron microscopy for a d escription of the spatial distribution of the elements and the structu re of surface layers are discussed. Methods for employing surface anal ysis to determine parameters which govern the kinetics of reactions be tween glasses and oxides is discussed. Developments in analysis method s and spectroscopy, which will form a basis for improved structural mo dels of non-crystalline materials, thin layers and coatings, and for t he simulation of chemical interaction of these materials with adjacent materials are also discussed.