Jc. Zwinkels et al., DESIGN AND TESTING OF A 2-MONOCHROMATOR REFERENCE SPECTROFLUOROMETER FOR HIGH-ACCURACY TOTAL RADIANCE FACTOR MEASUREMENTS, Applied optics, 36(4), 1997, pp. 892-902
A two-monochromator reference spectrofluorimeter has been developed at
the National Research Council of Canada in accordance with Internatio
nal Commission on Illumination and American Society for Testing and Ma
terials colorimetry standards to permit high-accuracy total spectral r
adiance factor measurements of fluorescent materials. This fully autom
ated instrument employs a xenon-are light source, all-reflective optic
s, two grating monochromators with order-sorting filters, a cooled pho
tomultiplier tube analyzing detector, and a calibrated silicon photodi
ode monitor detector. The instrument operating range is 250-1050 nm wi
th a selectable bandpass (optimized for a 5-nm resolution), and the me
asurement geometry is 45 degrees annular illumination and 0 degrees vi
ewing (45/0). We describe the instrument's design, testing, and verifi
cation procedures. Systematic errors that have been determined and cor
rected for include instrument polarization, beam nonuniformity, wavele
ngth shifts, stray light, and system drift. The wavelength accuracy an
d reproducibility are estimated to better than +/-0.1 and +/-0.03 nm,
respectively. The photometric short-term repeatability and long-term r
eproducibility are estimated to be better than +/- 0.15% and +/- 0.5%,
respectively. The overall photometric accuracy is better than 1% of t
he value over a wide range of reflectances, and the reproducibility of
the color specification of a fluorescent material is better than 0.25
Delta E(ab) units. (C) 1997 Optical Society of America