The influence of electric ''drift'' fields in the base of silicon sola
r cells on device performance is investigated. The drift fields are th
e result of a nonuniform dopant density in the base material. Numerica
l modelling is carried out for a range of representative cell structur
es and two different models for the dependence of the minority carrier
lifetime on the dopant density. The cell design variables, in particu
lar the dopant densities and the thicknesses of the device regions, ar
e optimized with respect to the cell efficiency. Comparison of optimiz
ed cells incorporating a drift field with those not having a drift fie
ld, shows that a drift field can offer only small efficiency advantage
s for particular cell structures and recombination parameters, and onl
y if large variations in dopant concentration can be achieved.