A new approach to the fabrication of model structures for nanoelectron
ics with characteristic sizes down to 10 nm is proposed. The approach
consists in electron-beam-induced fabrication of self-supporting struc
tures of nanometre sizes in a through slit formed in the substrate, fo
llowed by the deposition of a required material onto the structure, wh
ich serves as an active layer in a nanometre-scale device. Features of
the fabrication steps are discussed. Bismuth nanobridges were fabrica
ted and their voltage-current characteristics were measured, which dem
onstrated features of electron transport in these bridges connected wi
th their small sizes and inner structures.