Mcm. Vandesanden et al., THE ROLE OF HYDROGEN DURING PLASMA BEAM DEPOSITION OF AMORPHOUS THIN-FILMS, Surface & coatings technology, 74-5(1-3), 1995, pp. 1-9
The influence of wall-associated H-2 molecules and other hydrogen-cont
aining monomers on the degree of ionization in the expanding thermal p
lasma used for the fast plasma beam deposition of amorphous hydrogenat
ed carbon (a-C:H) and amorphous hydrogenated silicon (a-Si:H) was dete
rmined. Deposition models are discussed with emphasis on the specific
role of the ion during deposition. The connection between the role of
atomic hydrogen and the degree of ionization in the plasma beam deposi
tion of a-C:H and a-Si:H is addressed.