C. Sella et al., NEUTRON AND SOFT-X-RAY MULTILAYERED MIRRORS DEPOSITED BY TRIODE SPUTTERING USING AN AUTOMATIC ACCURATE THICKNESS MONITORING TECHNIQUE, Surface & coatings technology, 74-5(1-3), 1995, pp. 567-570
High reflectivity neutron and X-ray multilayered mirrors require perfe
ctly smooth, sharp interfaces, uniform layer thicknesses and densities
and a high stack regularity. This can be achieved using a low energy
triode sputtering unit equipped with three 10 x 30 cm(2) targets and a
n accurate thickness monitoring system which is based on the dependenc
e of the deposition rate on the target current. Thicknesses can be con
trolled with an accuracy of better than 1 Angstrom and reproducibility
is better than 1%. Therefore experimental neutron and X-ray specular
reflection profiles of multilayered mirrors are in perfect agreement w
ith the theoretical profiles, indicating a high stack regularity. This
system is successful in producing high reflectivity soft X-ray mirror
s in the 100-1000 eV range, as well as high quality periodic monochrom
ators for unpolarized and polarized neutron optics. Moreover this tech
nique is also appropriate for producing high reflectivity aperiodic st
acks called neutron supermirrors.