We investigate the driving forces that determine the growth mode of he
teroepitaxial Ge layers grown from solution on Si substrates with orie
ntations (001), (011) and (111) by transmission electron microscopy (T
EM) and atomic force microscopy (AFM). Using liquid phase epitaxy, we
can study the influences of strain and surface energy terms independen
tly on effects due to limited surface diffusion. In (001) and (011) or
ientated layers, (111) faceted islands form (Stranski-Krastanov growth
). In contrast, (111) orientated layers grow in a two-dimensional step
flow growth mode (Frank-van der Merwe growth). We model these investi
gations in terms of energy minimisation considering surface energy red
uction by formation of faceted islands and elastic strain energy relax
ation by island formation. The strain energy relaxation by island form
ation is calculated by the finite element method. According to our con
siderations, two-dimensional growth is obtained by selective increase
of the free surface energy of the low indices facet planes to a value
higher than that of the substrate surface. Formation of faceted island
s thus would increase the total surface energy; as a consequence, isla
nd formation is suppressed. By choosing the appropriate solvent and te
mperature in solution growth, we can provide for thermodynamically sta
ble two-dimensional growth.