Films of SiC have been grown on AlN/Al2O3 substrates by reactive magne
tron sputtering. The resistivity of the films can be varied over seven
orders of magnitude by varying the growth temperature (or the tempera
ture of the subsequent annealing). This variation in resistivity sugge
sts an amorphous-polycrystalline phase transition of the SiC. (C) 1995
American Institute of Physics.