Mp. Silverman et al., THE BRIGHTEST BEAM IN SCIENCE - NEW DIRECTIONS IN ELECTRON-MICROSCOPYAND INTERFEROMETRY, American journal of physics, 63(9), 1995, pp. 800-813
An ultrasharp electron field-emission source, with emission region on
the order of atomic size (i.e., fraction of a nanometer), produces a b
right, strongly self-focused, highly coherent electron beam-indeed the
brightest particle beam currently known to science. Employed in the c
onfiguration of a point-production microscope, this ''nanotip'' source
facilitates low-energy electron imaging of fragile structures at atom
ic-scale resolution. When slightly out of focus, the microscope serves
as perhaps the world's simplest electron interferometer providing Fre
snel diffraction patterns from which important information like effect
ive source size, source brightness, and beam degeneracy can be determi
ned. One remarkable feature of point sources is the perfect (i.e., abe
rration-free), lensless imaging of periodic structures at a denumerabl
e set of focal planes with complete suppression of nonperiodic detail.
The high degeneracy and coherent emission of an electron pointlike so
urce can be exploited in new. types of quantum interferometry involvin
g correlated electrons. (C) 1995 American Association of Physics Teach
ers.