EFFECT OF GROWTH-CONDITIONS ON THE ELECTRICAL-PROPERTIES OF NB AL-OXIDE/NB TUNNEL-JUNCTIONS/

Authors
MALLISON WH MILLER RE KLEINSASSER AW
Citation
Wh. Mallison et al., EFFECT OF GROWTH-CONDITIONS ON THE ELECTRICAL-PROPERTIES OF NB AL-OXIDE/NB TUNNEL-JUNCTIONS/, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 2330-2333
Citations number
10
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
IEEE transactions on applied superconductivity → ACNP
ISSN journal
10518223
Volume
5
Issue
2
Year of publication
1995
Part
3
Pages
2330 - 2333
Database
ISI
SICI code
1051-8223(1995)5:2<2330:EOGOTE>2.0.ZU;2-E
Abstract
We have investigated the dependence of the critical current density J( c) of Nb/AlOx/Nb Josephson tunnel junctions on substrate temperature T -s and oxygen exposure E (the product of oxidation time and pressure) during growth. For low O-2 exposures, J(c) depended sensitively on exp osure, J(c) proportional to E(-1.6), independent of temperature for 77 K < T-s < 420 K. For high O-2 exposures, J(c) depended strongly on te mperature, with a weaker dependence on exposure: For T-s = 290 K, J(c) proportional to E(-0.4), while for T-s = 77 K, J(c) was independent o f exposure.