Some metallic oxides are prospective barrier materials for high-T-c su
perconducting SNS junctions. Among them, SrVO3 is a metallic oxide wit
h a bulk resistivity of 1-1000 mu Omega-cm and a cubic perovskite-type
crystal structure. The lattice constant of SrVO3 is 3.84 Angstrom, wh
ich is close to that of the high-T-c superconductor YBa2Cu3O7-x (YBCO,
a = 3.82 Angstrom, b = 3.89 Angstrom). We report the fabrication of m
etallic SrVO3 thin films and YBCO/SrVO3/YBCO trilayers using pulsed la
ser ablation. The crystal structure and surface morphology of the film
s were studied by X-ray diffraction and AFM. The electrical properties
of the films were measured by the standard four probe method. The pot
ential application of SrVO3 thin films for the barriers of high-T-c su
perconducting SNS junctions will be discussed.