SILICON ION-IMPLANTATION OF YBACUO FILMS FOR BOLOMETER APPLICATION

Citation
X. He et al., SILICON ION-IMPLANTATION OF YBACUO FILMS FOR BOLOMETER APPLICATION, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 2439-2442
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
5
Issue
2
Year of publication
1995
Part
3
Pages
2439 - 2442
Database
ISI
SICI code
1051-8223(1995)5:2<2439:SIOYFF>2.0.ZU;2-I
Abstract
Silicon ion implantation was used to shift the critical temperature of YBaCuO films continuously to lower temperatures. The variation of T-c and other superconducting properties with ion fluence was investigate d in detail. Based on these results a new bolometer structure was desi gned, fabricated and characterised, The sensor area of the bolometer c onsists of a locally implanted area with a lower critical temperature, while the contact pads and connecting lines retain the original T-c. At the operating temperature the bolometer has a exactly defined tempe rature sensitive area and shows a lower contact resistance. Finally th e feasibility of integrated bolometer arrays is discussed.