OPTICAL DIAGNOSTICS FOR FABRICATION OF YBCO THIN-FILM DC-SQUIDS

Citation
An. Obraztsov et al., OPTICAL DIAGNOSTICS FOR FABRICATION OF YBCO THIN-FILM DC-SQUIDS, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 2517-2520
Citations number
17
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
5
Issue
2
Year of publication
1995
Part
3
Pages
2517 - 2520
Database
ISI
SICI code
1051-8223(1995)5:2<2517:ODFFOY>2.0.ZU;2-7
Abstract
Optical reflectance spectra of thin YBCO films on SrTiO3 bicrystals we re measured in a photon energy range of 1-3 eV at room temperature. Ra man spectra measurements in range 200-700 cm(-1) were performed. The b est samples were shown to have high reflectance anisotropy and well-de fined peak nu(1)=500+/-1 cm(-1) in Raman spectra. YBCO thin films on b icrystal substrate that successfully passed optical control were used for Josephson junctions and dc SQUIDs fabrication. The fabricated dc S QUIDs operated at 77.3 K in the flux locked loop mode had a typical wh ite noise (1-2)x10(-5) Phi(0)/Hz(1/2) at frequencies higher than 200-5 00 Hz. The best obtained magnetic field resolution was 650 fT/Hz(1/2) at frequencies f > 200 Hz.