D. Vanvechten et al., MODELING THE SPECTRA OF SUPERCONDUCTING TUNNEL JUNCTION X-RAY-DETECTORS, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 3030-3033
SIS tunnel junctions (STJD) are predicted to have exceptionally good e
nergy resolution as x-ray detectors. This paper interprets spectra ill
ustrative of the current state of the art. They were obtained when Fe-
55 and Cd-109 x-ray sources bombarded an epitaxial base layer Nb/Ta/Al
/AlOx/Al/Nb junction having a diamond shape and sides 15 microns long.
Our model of energy loss vial the escape of photoelectrons early in t
he energy cascade is demonstrated to be qualitatively correct. Earlier
results based on fine-grained junctions suggested that such small are
a devices will have a large characteristic ''foot'' (asymmetric broade
ning of low energy side) on the peaks in the spectra that correspond t
o complete capture of the incident energy in the device. Our device is
small, yet its full energy peaks lack significant feet. We conclude t
hat this device is in the fast diffusion limit. This result contradict
s the suggestion that Andreev reflection should severely restrict late
ral diffusion in clean superconducting bilayers.