ELECTROMAGNETIC PROPERTIES OF YBA2CU3O7-DELTA THIN-FILM GRAIN-BOUNDARY WEAK LINKS

Citation
Bh. Moeckly et Ra. Buhrman, ELECTROMAGNETIC PROPERTIES OF YBA2CU3O7-DELTA THIN-FILM GRAIN-BOUNDARY WEAK LINKS, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 3414-3417
Citations number
21
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
5
Issue
2
Year of publication
1995
Part
3
Pages
3414 - 3417
Database
ISI
SICI code
1051-8223(1995)5:2<3414:EPOYTG>2.0.ZU;2-2
Abstract
The I-V characteristics of thin film microbridges containing 90 degree s basal-plane-faced tilt boundaries (TBs) exhibit pronounced resonant structure. This structure is attributable to the presence of ''beating modes'' previously studied in high Q DC SQUID structures having subst antial shunt capacitance and large inductance. Less pronounced but cle ar resonant structure is also observable in in-plane c-axis TBs. We di scuss a model which accounts for this behavior.