Sb. Hudson et C. Riley, DETERMINING ELECTRODE POSITION AND SOURCE COHERENCE IN SPECTROELECTROCHEMICAL ANALYSES WITH PARALLEL GEOMETRIES, Journal of electroanalytical chemistry [1992], 393(1-2), 1995, pp. 1-6
Whenever a monochromatic collimated light beam illuminates a planar el
ectrode surface parallel to that surface, a diffraction pattern charac
teristic of the beam's coherence is obtained. The electrode edge posit
ion is generally determined utilizing a procedure which assumes either
a totally coherent or an incoherent source. In this work, the image o
f the diffraction pattern was magnified and focused on a diode array,
and the resulting intensity profile was compared with that obtained fr
om a slightly defocused image. Perturbation theory was applied to pred
ict the position of the electrode's edge. Once the edge position was k
nown, the source's coherence was determined from the normalized intens
ity at the electrode's edge. This technique can be utilized in situ wi
th ''parallel'' spectroelectrochemical experiments. It does not depend
on a priori knowledge of the light source's coherence nor does it req
uire an opaque-translucent interface. A simple model and experimental
data employing this method are presented. Measurements of the experime
ntal electrode positions were reproducible within the theoretical magn
ifier/array limit, 1 mu m