A BIASED OPTICAL PROBE METHOD FOR MEASUREMENTS OF ELECTRON-ENERGY DISTRIBUTION IN A PLASMA

Citation
H. Sugai et al., A BIASED OPTICAL PROBE METHOD FOR MEASUREMENTS OF ELECTRON-ENERGY DISTRIBUTION IN A PLASMA, Plasma sources science & technology, 4(3), 1995, pp. 366-372
Citations number
11
Categorie Soggetti
Phsycs, Fluid & Plasmas
ISSN journal
09630252
Volume
4
Issue
3
Year of publication
1995
Pages
366 - 372
Database
ISI
SICI code
0963-0252(1995)4:3<366:ABOPMF>2.0.ZU;2-T
Abstract
A biased optical probe (BOP) method, i.e. novel technique for measurem ents of the electron energy distribution function (EEDF) in a range of such high energies as 10-50 eV has been developed. This method is bas ed on the optical emission induced by electrons passing through a nega tively biased mesh in a plasma. The BOP method was used to measure the EEDF in a do glow discharge in He/Xe mixture while the low-energy par t (< 10 eV) of the EEDF was measured using the conventional Druyvestey n method. The measured distribution function considerably deviates fro m an ideal Maxwellian distribution, because of abundant high-energy el ectrons generated in a cathode fall. On the contrary, the EEDF measure d in a low-pressure inductive rf discharge was found to follow a singl e Maxwellian distribution over a wide energy range.