A. Dollet et al., ANALYSIS AND MODELING OF A PULSED-PLASMA REACTOR FOR SILICON-NITRIDE DEPOSITION - REACTOR OPTIMIZATION, Plasma sources science & technology, 4(3), 1995, pp. 459-473
Numerical modelling of a RF pulsed plasma reactor for silicon nitride
deposition from SiH4/NH3 mixture was carried out and a detailed treatm
ent of both electrical and mass transfer phenomena performed. Starting
from two-dimensional simulations of the concentration profiles, some
a posteriori simplifications were made to shorten the calculation time
. The resulting numerical procedure, which was much more rapid, was fo
und to be very accurate. The homogeneous and heterogeneous chemical me
chanisms selected were previously investigated for a continuous-wave p
lasma; the good agreement achieved between calculation and experiment
suggests that, on the whole, realistic choices were made. In the case
of a pulsed-plasma reactor, good agreement was also found between calc
ulation and experiment. It was shown that the use of a pulsed discharg
e was necessary to obtain uniform thickness and composition over all s
amples when using a low silane percentage in the gaseous mixture. An a
ttempted reactor preoptimization was satisfactorily performed, in the
light of the experimental correlation between electrical properties an
d chemical bonding in the deposited films.