Reactive ion etched silicon carbide mesa pin diodes with voltage block
ing capabilities as high as 4.5 kV have been fabricated from 6H-SiC ep
itaxial layers. The epitaxial structure was grown by chemical vapor de
position on an n(+) substrate giving a low-doped 45 mu m thick n(-) ac
tive base layer and a 1.5 mu m thick high-doped p(+) emitter layer on
top. A high minority carrier lifetime of 0.43 mu s in the n(-) active
base layer provides good on-state properties with a typical forward vo
ltage drop of 6 V at 100 A/cm(2). (C) 1995 American Institute of Physi
cs.