The lattice parameter of undoped and boron doped polycrystalline diamo
nd films has been measured up to 8X10(20) B cm(-3). It varies slightly
according to the three crystallographic directions [111], [220], and
[311] investigated here. The cell parameters for the undoped films are
within the published values for synthetic crystal and thin films. For
the boron doped films, the cell parameter has a high expansion coeffi
cient versus boron incorporation, with a mean value of Delta a/a=3X10(
-24) [B], ([B] in cm(-3)), and a variation law in the [220] direction
in striking agreement with a Russian work. The simplest Vegard model p
redicts a smaller variation, while both the deformation potential (but
with a high deformation potential on the boron impurity band of +19.5
eV) and a defect model might explain the experimental results. (C) 19
97 American Institute of Physics.