ELECTROCHROMIC CONTROL OF THIN-FILM LIGHT-SCATTERING

Total and diffuse reflectance spectra were measured on Al surfaces cov ered with electrochromic W oxide films in colored and bleached states. Vector perturbation theory was used for analyzing the spectra. The di ffuse reflectance appeared to originate from correlated (uncorrelated) interface roughness when the W oxide film was fully colored (bleached ). Assuming partially correlated interfaces led to agreement between e xperimental and calculated spectra. The use of an electrochromic film appears a promising method to control the relative contributions of th e interfaces to the resulting scattering. (C) 1997 American Institute of Physics.